Final Year Project

by LOON LIH MIN

Title

CHARACTERIZATION OF GATE-ALL-AROUND HETEROSTRUCTURE STRAINED-SILICON NANOWIRE FIELD-EFFECT TRANSISTOR

Abstract

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Device Structure

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Gantt Chart FYP1

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Gantt Chart FYP2

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Updated on 25 May 2018, 2:38 PM; 702 page visits from 19 May 2018 to 5 April 2026